%0 Journal Article %J SIGCOMM Comput. Commun. Rev. %D 2013 %T Standardizing large-scale measurement platforms %A Bagnulo Marcelo %A Eardley Philip %A Burbridge Trevor %A Brian Trammell %A Rolf Winter %K design %K ietf %K measurement platforms %K standardization %B SIGCOMM Comput. Commun. Rev. %V 43 %P 58–63 %G eng %U http://doi.acm.org/10.1145/2479957.2479967 %R 10.1145/2479957.2479967